CNVD-2025-02725

Vulnerability from cnvd - Published: 2025-02-12
VLAI
Title
Samsung RRC MeasurementReport异常条件处理漏洞
Description
Samsung RRC MeasurementReport是三星(Samsung)移动设备的无线资源控制协议测量报告。 Samsung RRC MeasurementReport存在异常条件处理漏洞,该漏洞源于Exynos基带中缺少正确的RRC安全变量检查,攻击者可利用该漏洞跟踪位置。
Severity
中
Patch Name
Samsung RRC MeasurementReport异常条件处理漏洞的补丁
Patch Description
Samsung RRC MeasurementReport是三星(Samsung)移动设备的无线资源控制协议测量报告。 Samsung RRC MeasurementReport存在异常条件处理漏洞,该漏洞源于Exynos基带中缺少正确的RRC安全变量检查,攻击者可利用该漏洞跟踪位置。目前,供应商发布了安全公告及相关补丁信息,修复了此漏洞。
Formal description

厂商已发布了漏洞修复程序,请及时关注更新: https://security.samsungmobile.com/securityUpdate.smsb?year=2021&month=12

Reference
https://nvd.nist.gov/vuln/detail/CVE-2021-25516
Impacted products
Name
['Samsung Samsung mobile devices R(11.0) (Exynos芯片组)', 'Samsung Samsung Mobile devices Q(10.0) (Exynos芯片组)', 'Samsung Samsung Mobile devices P(9.0) (Exynos芯片组)']
Show details on source website

{
  "cves": {
    "cve": {
      "cveNumber": "CVE-2021-25516",
      "cveUrl": "https://nvd.nist.gov/vuln/detail/CVE-2021-25516"
    }
  },
  "description": "Samsung RRC MeasurementReport\u662f\u4e09\u661f\uff08Samsung\uff09\u79fb\u52a8\u8bbe\u5907\u7684\u65e0\u7ebf\u8d44\u6e90\u63a7\u5236\u534f\u8bae\u6d4b\u91cf\u62a5\u544a\u3002\n\nSamsung RRC MeasurementReport\u5b58\u5728\u5f02\u5e38\u6761\u4ef6\u5904\u7406\u6f0f\u6d1e\uff0c\u8be5\u6f0f\u6d1e\u6e90\u4e8eExynos\u57fa\u5e26\u4e2d\u7f3a\u5c11\u6b63\u786e\u7684RRC\u5b89\u5168\u53d8\u91cf\u68c0\u67e5\uff0c\u653b\u51fb\u8005\u53ef\u5229\u7528\u8be5\u6f0f\u6d1e\u8ddf\u8e2a\u4f4d\u7f6e\u3002",
  "formalWay": "\u5382\u5546\u5df2\u53d1\u5e03\u4e86\u6f0f\u6d1e\u4fee\u590d\u7a0b\u5e8f\uff0c\u8bf7\u53ca\u65f6\u5173\u6ce8\u66f4\u65b0\uff1a\r\nhttps://security.samsungmobile.com/securityUpdate.smsb?year=2021\u0026month=12",
  "isEvent": "\u901a\u7528\u8f6f\u786c\u4ef6\u6f0f\u6d1e",
  "number": "CNVD-2025-02725",
  "openTime": "2025-02-12",
  "patchDescription": "Samsung RRC MeasurementReport\u662f\u4e09\u661f\uff08Samsung\uff09\u79fb\u52a8\u8bbe\u5907\u7684\u65e0\u7ebf\u8d44\u6e90\u63a7\u5236\u534f\u8bae\u6d4b\u91cf\u62a5\u544a\u3002\r\n\r\nSamsung RRC MeasurementReport\u5b58\u5728\u5f02\u5e38\u6761\u4ef6\u5904\u7406\u6f0f\u6d1e\uff0c\u8be5\u6f0f\u6d1e\u6e90\u4e8eExynos\u57fa\u5e26\u4e2d\u7f3a\u5c11\u6b63\u786e\u7684RRC\u5b89\u5168\u53d8\u91cf\u68c0\u67e5\uff0c\u653b\u51fb\u8005\u53ef\u5229\u7528\u8be5\u6f0f\u6d1e\u8ddf\u8e2a\u4f4d\u7f6e\u3002\u76ee\u524d\uff0c\u4f9b\u5e94\u5546\u53d1\u5e03\u4e86\u5b89\u5168\u516c\u544a\u53ca\u76f8\u5173\u8865\u4e01\u4fe1\u606f\uff0c\u4fee\u590d\u4e86\u6b64\u6f0f\u6d1e\u3002",
  "patchName": "Samsung RRC MeasurementReport\u5f02\u5e38\u6761\u4ef6\u5904\u7406\u6f0f\u6d1e\u7684\u8865\u4e01",
  "products": {
    "product": [
      "Samsung Samsung mobile devices R(11.0) (Exynos\u82af\u7247\u7ec4)",
      "Samsung Samsung Mobile devices Q(10.0) (Exynos\u82af\u7247\u7ec4)",
      "Samsung Samsung Mobile devices P(9.0) (Exynos\u82af\u7247\u7ec4)"
    ]
  },
  "referenceLink": "https://nvd.nist.gov/vuln/detail/CVE-2021-25516",
  "serverity": "\u4e2d",
  "submitTime": "2021-12-14",
  "title": "Samsung RRC MeasurementReport\u5f02\u5e38\u6761\u4ef6\u5904\u7406\u6f0f\u6d1e"
}



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Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.

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Nomenclature

  • Seen: The vulnerability was mentioned, discussed, or observed by the user.
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Related by attack behaviour

Vulnerabilities whose description is nearest to this one in the vector space of the CIRCL/vulnerability-attack-technique-biencoder model. This is a similarity search over the bi-encoder space (plain cosine), not a classification, and it has no measured accuracy.


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